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MAXQ7665/MAXQ7666 User’s Guide
3-37
3.4.4.1 Differential Temperature Measurement
For differential temperature measurements, connect the anode of a diode-connected transistor to the even input channel and the cath-
ode to the odd input channel of an input pair AIN0/AIN1 or AIN2/AIN3. Run the two sensor connection lines parallel to each other with
minimum spacing. This improves temperature measurement accuracy by minimizing the differential noise between the two lines, since
they have equal exposure to most sources of noise. For further improved noise rejection, shield the two sensor connections by running
them between ground planes, when available.
Configure the MAXQ7665/MAXQ7666 temperature sensor and ADC as explained in
Section 3.4.2
for differential mode (ADCDIF = 1)
and enable the remote temperature measurement on an even channel AIN0 or AIN2 (ADCMX2 and ADCMX1 = 01 or 10).
3.4.4.2 Single-Ended Temperature Measurement
For single-ended temperature measurements, connect the anode of a diode-connected transistor to the even input channel AIN0 or
AIN2 and the cathode to the ground. Choose ground connections for sensors away from high-current return paths to avoid the intro-
duction of errors caused by voltage drops in the boards/system ground, which is the main drawback for single-ended measurements.
Practical options for better accuracy are the use of a star-configured subsystem ground or a signal ground plane; to isolate the anode
sensor connection trace away from board and system noise sources; or to shield it with ground lines and ground planes (when avail-
able) to prevent accuracy degradation in the temperature measurements caused by magnetic/electric noise induction.
Configure the MAXQ7665/MAXQ7666 temperature sensor and ADC as explained in
Section 3.4.2
for single-ended mode (ADCDIF = 0)
and enable the remote temperature measurement on an even channel AIN0 or AIN2 (ADCMX2 and ADCMX1 = 01 or 10).
3.4.5 Remote Temperature Sensor Selection
Temperature-sensing accuracy depends on having a good quality, diode-connected, small-signal transistor as a sensor. Accuracy has
been experimentally verified for 2N3904-type devices. The transistor must be a small-signal type with low base resistance. See Table
3-11 for recommended devices.
Table 3-11. Remote Sensor Transistor Manufacturers
3.5 Digital-to-Analog Converter (DAC) Port
The MAXQ7665/MAXQ7666 have a true 12-bit voltage-output DAC with buffered outputs that supports a 15µs maximum settling time
at a 12-bit level. The DAC provides a gain of 1 relative to the external REFDAC reference voltage. The MAXQ7665/MAXQ7666 DAC
features include:
• 12-bit voltage-output DAC
• 8µs typical and 15µs maximum settling time
• Unity gain output buffer
• External reference
• Straight binary input
• Double-buffered data
• DAC load control from external pin or software write
MANUFACTURER MODEL NUMBER
Central Semiconductor (CMPT) CMPT3904
Fairchild Semiconductors (USA) MMBT3904
ON Semiconductor (USA) MMBT3904
Rohm Semiconductor (Japan) SST3904
Zetex (England) FMMT3904CT-ND
Diodes Inc. MMBT3904
Maxim Integrated
- Functional Diagrams 1
- 1.1 Overview 7
- 1.1.2 Instruction Set 8
- 1.1.4 Register Space 8
- 1.2 Architecture 9
- 1.2.1 Instruction Decoding 10
- 1.2.2 Register Space 11
- 1.2.3 Memory Organization 13
- 1.2.3.2 Utility ROM 16
- 1.2.3.3 Data Memory 16
- 1.2.3.4 Stack Memory 17
- 1.2.3.7 Data Alignment 19
- CDA0 = 1 21
- 1.2.4 Interrupts 25
- 1.3 Programming 31
- 1.3.6.1 Sign Flag 37
- 1.3.6.2 Zero Flag 38
- 1.3.6.3 Equals Flag 38
- 1.3.6.4 Carry Flag 38
- 1.3.6.5 Overflow Flag 39
- 1.3.7.2 Unconditional Jumps 39
- 1.3.7.3 Conditional Jumps 40
- 1.3.7.4 Calling Subroutines 40
- 1.3.7.5 Looping Operations 40
- 1.3.8 Handling Interrupts 41
- 1.3.9 Accessing the Stack 42
- 1.3.10 Accessing Data Memory 43
- 1.4.19 General Register (GR) 59
- 2.1 Architecture 75
- 2.3 Supply Configuration 83
- 2.4 Linear Regulator 84
- 2.5 Power-On Reset 84
- 2.5.1 Power-Up Counter 85
- 2.5.3 Reset Output 87
- 2.7 Reset Mode 89
- 2.7.2 External Reset 90
- 2.7.3 Internal System Reset 90
- SECTION 3: ANALOG I/O MODULE 91
- 3.1.1 Analog I/O Pins 96
- Register Name: ACNT 98
- ADCMX2 ADCMX1 FUNCTION 99
- 1 1 Reserved 99
- Maxim Integrated 100
- Section 5 104
- Section 2 104
- Section 3.3.6 107
- Section 3.4 107
- Table 3-2. ADC Signals 108
- Section 3.3.10 110
- 3.3.4 Unipolar/Bipolar 111
- 3.3.5 Transfer Function 112
- Section 3.3.3 115
- Section 3.3.5 115
- 3.3.7 Analog Input Protection 116
- 3.3.8 ADC Clock 117
- 3.3.9 Auto Shutdown Mode 117
- 3.3.11 ADC Interrupts 122
- 3.3.12 Using the ADC 123
- 3.4 Temperature Sensor 124
- Sections 15 125
- TEMPERATURE (°C) 126
- Section 3.4.2 127
- Table 3-12. DAC Signals 128
- 3.5.4 DAC Power-Down 130
- 3.5.5 Using the DAC 130
- LIST OF FIGURES 133
- LIST OF TABLES 133
- 4.1 Architecture 134
- 4.2 CAN Controller Registers 136
- 4.3 CAN Operations 177
- 4.3.1.2 Remote Frame 180
- 4.3.1.3 Error Frame 181
- 4.3.1.4 Overload Frame 181
- 4.5 External Pins 182
- 4.7 CAN Interrupts 183
- 4.8.1 Message Center 15 185
- 4.9.2 Receiving Data Messages 186
- 4.15 Bit Timing 194
- 4.16 CAN Bus Activity 197
- 5.1 Architecture 200
- Section 3 204
- 76543210 205
- Reset 0 0 1 0 0 0 0 1 205
- Access rw r r rw rw rw rw rw 205
- 5.3 System Clock Generation 209
- 5.4 Watchdog Timer 215
- 5.5 Power Management Mode 217
- 5.5.2 Switchback Mode 218
- 5.5.3 Stop Mode 218
- SECTION 6: SERIAL I/O MODULE 219
- 6.1.1 UART Pins 223
- 6.2 UART Registers 223
- Serial Mode Definition 224
- — — — — — — — 226
- 6.3 Modes of Operation 227
- 6.3.3 UART Mode 2 230
- 6.3.4 UART Mode 3 230
- 6.4 Baud-Rate Generation 233
- 6.4.4 Baud-Clock Generator 234
- 6.5 Framing Error Detection 235
- 7.1 Architecture 238
- Compare Mode: 244
- Capture Mode: 244
- 7.2.3 Type 2 Reload Registers 248
- 7.3.3 16-Bit Counter 255
- 7.3.4 Dual 8-Bit Timers 256
- 7.4.3 Measure Period 259
- 8.1 Architecture 264
- 8.1.1 Port Pins 265
- 8.2 Port Registers 265
- 8.3 GPIO Operation 271
- 8.3.4 Port Pin Examples 273
- 9.1 Architecture 276
- 9.1.1 SPI Pins 277
- 9.2 SPI Peripheral Registers 277
- 9.3 SPI Operation 282
- 9.3.2 SPI Slave Operation 283
- 9.3.3 SPI Transfer Formats 284
- 9.4 SPI Transfer Baud Rates 285
- 9.5 SPI System Errors 285
- 9.6 SPI Interrupts 286
- 10.1 TAP Overview 289
- 10.2 Architecture 289
- 10.2.1 TAP Pins 290
- 10.3 TAP Interface Control 291
- 10.4 TAP Controller Operation 292
- 10.4.2 Run-Test-Idle 293
- 10.4.3 IR-Scan Sequence 293
- 10.4.5 Communication via TAP 294
- 11.1 Architecture 299
- Section 12 303
- Section 10 305
- Section 1 305
- 11.3 Debug Engine Operation 306
- 11.3.2 Breakpoint Registers 308
- 11.3.3 Using Breakpoints 310
- 11.3.4 Debug Mode 311
- 11.3.5 Debug Mode Commands 311
- 11.3.8 Return 313
- 12.1 Bootstrap-Loader Mode 317
- Section 11 318
- Section 12.5 320
- 12.5 JTAG Bootloader Protocol 321
- 13.6 Operand Count Selection 335
- 13.8 Accessing the Multiplier 336
- Acc.<b> 343
- 1000 1010 0001 1010 345
- 1101 1010 0010 1010 346
- 0011 1100 ssss ssss 349
- 0111 1100 ssss ssss 349
- 1111 1010 bbbb 1010 352
- 1101 1010 0000 1010 353
- 1110 1010 bbbb 1010 353
- 1101 1010 0001 1010 354
- 1ddd dddd 0bbb 0111 354
- 1ddd dddd 1bbb 0111 354
- 1000 1010 1001 1010 355
- .<b> 356
- 1110 1100 0000 1101 359
- 1001 1100 0000 1101 359
- 1101 1100 0000 1101 359
- 1100 1100 0000 1101 359
- 1000 1100 1000 1101 360
- 1010 1100 1000 1101 360
- 1110 1100 1000 1101 360
- 1001 1100 1000 1101 361
- 1101 1100 1000 1101 361
- 1100 1100 1000 1101 361
- 1000 1010 0100 1010 362
- 1000 1010 0101 1010 362
- 1000 1010 1100 1010 363
- 1000 1010 1101 1010 363
- 1000 1010 0010 1010 364
- 1000 1010 0011 1010 364
- 1000 1010 0110 1010 364
- 1000 1010 1010 1010 365
- 1000 1010 1111 1010 365
- 1000 1010 1110 1010 366
- 1000 1010 1011 1010 366
- 1000 1010 0111 1010 368
- 1000 1010 1000 1010 368
- 1011 1010 bbbb 1010 369
- WITH TYPE A FLASH) 371
- 15.2 Data Transfer Functions 372
- TYPE F FLASH) 378
- 16.2 Data Transfer Functions 383
- REVISION HISTORY 386
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